Laser Black - Reflectivity - EPNER TECHNOLOGY INC.

Laser Black Specular Reflectance 2-5um

An aerospace prime contractor measured a 2″ dia. Laser Black sample (aluminum substrate) provided by Epner Technology on a Perkin Elmer 983 Spectrophotometer at a range of 2-5um, as well as a zero no sample measurement, an uncoated fused silica measurement and a plot. Along with the reflectance graph, they included directional hemispheric reflectance data from a Surface Optics Corp. SOC 410 instrument, which measures the diffuse and specular reflectance averaged over a filter bandwidth. For comparison, they also included a couple of other samples of black surface treatment.
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Reflectivity ( 2 – 20 micron )

Reflectivity ( 2 – 8 micron )

Reflectivity (7.00 – 12.00 µm)

By DRS Optronics Thin Film Lab

Reflectivity (200 nm – 2500 nm)

Two different instruments were used to measure the reflectance. One to scan from 200nm to 2,500nm. Both sides were measured and showed little difference. The reflectance to approximately 700 nm is really low, below 1%. Then as you see it rises to approximately 4% at 900 to 1,000 nm or so and decreases. The other curves, there are three, are all the same but displayed with differing expansion on the reflectance axis. These curves run from 2.5 microns to 20 microns.
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By TRW Space & Technology Group

Diffuse Reflectance of Laser Black on Thick Substrate

Measurements were provided by the National Institute of Standards and Technology (NIST) and made using a spectrometer coupled to an integrating sphere to enable total and diffuse reflectance measurements. In the “total” measurement the specular reflectance is included. In the “diffuse” measurement the specular beam is excluded, since the geometry is made that the specular reflection from the sample passes out of the integrating sphere through a port.
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By Joseph P. Rice and Yvonne Barnes